• X-ray diffraction topography and microradiography provide non-destructive imaging of crystal interiors, revealing defects, dislocations, and micro-structure through projection topographs and high-resolution diffraction images, including Vidicon-based readouts for magnified visualization of dislocations. [4] [14] [19]

• Quantitative interpretation of diffraction line shapes, widths, and intensities advanced via Fourier analysis, geometric broadening considerations, and absorption corrections, enabling reconstruction of underlying particle-size or distribution profiles from powder diffraction data. [1] [3] [11] [10]

• Instrumentation and detection development for X-ray imaging/spectroscopy, including curved-crystal spectrometers for high resolution, gas-flow counters for soft X-rays, and Vidicon-based imaging, accelerating data acquisition and resolution in X-ray experiments. [5] [9] [19] [6]

• Crystal orientation and texture determination via diffraction methods, featuring direct orientation measurements, pole-figure-like approaches, and error analyses to refine quantitative texture descriptions from X-ray data. [16] [15] [2]

• Spectroscopy and absorption modeling in X-ray measurements, addressing energy distribution determination by absorption methods, thickness effects near absorption edges, and numerical absorption corrections for accurate quantitative analysis. [18] [7] [13]